Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10914694 | X-ray spectrometer | Joel Ullom, Galen O'Neil, Luis Miaja Avila, Kevin Silverman, Daniel Swetz +11 more | 2021-02-09 |
| 10685759 | Statistical analysis in X-ray imaging | Andrew Maurice Kingston, Glenn Myers, Mahsa Paziresh, Trond Karsten Varslot | 2020-06-16 |