Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10685759 | Statistical analysis in X-ray imaging | Wilfred K. Fullagar, Andrew Maurice Kingston, Glenn Myers, Trond Karsten Varslot | 2020-06-16 |
| 10354418 | Tomographic reconstruction for material characterization | Benoit Recur, Glenn Myers, Andrew Maurice Kingston, Shane Latham | 2019-07-16 |