Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8907305 | Charged particle detector | Eric Kneedler | 2014-12-09 |
| 8742361 | Focused charged particle column for operation at different beam energies at a target | Mostafa Maazouz | 2014-06-03 |
| 8314404 | Distributed ion source acceleration column | Jabez J. McClelland, Brenton J. Knuffman, Adam V. Steele | 2012-11-20 |
| 8053725 | Beam quality in FIB systems | Gregory A. Schwind | 2011-11-08 |
| 5015862 | Laser modulation of LMI sources | J. Fred Holmes, Karl J. Jousten | 1991-05-14 |
| 4698129 | Focused ion beam micromachining of optical surfaces in materials | Joseph Puretz, Richard K. DeFreez, Richard A. Elliott | 1987-10-06 |
| 4629898 | Electron and ion beam apparatus and passivation milling | Lynwood W. Swanson | 1986-12-16 |
| 4426582 | Charged particle beam apparatus and method utilizing liquid metal field ionization source and asymmetric three element lens system | Lynwood W. Swanson | 1984-01-17 |