AH

Adrianus Franciscus Johannes Hammen

FE Fei: 1 patents #375 of 681Top 60%
Overall (All Time): #1,434,317 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11024481 Scanning electron microscope Karel Diederick Van Der Mast, Wilhelmus Henrica Cornelis Theuws, Sander Richard Marie Stoks 2021-06-01
10796879 Scanning electron microscope Karel Diederick Van Der Mast, Wilhelmus Henrica Cornelis Theuws, Sander Richard Marie Stoks 2020-10-06
10580613 Sample stage Gerhardus Bernardus Stamsnijder, Paul Cornelis Maria van den Bos, Ton Antonius Cornelis Henricus Kluijtmans, Sander Richard Marie Stoks, Karel Diederick Van Der Mast 2020-03-03