Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5430400 | Driver circuits for IC tester | Sergio A. Sanielevici, Burnell G. West, David K. Cheung | 1995-07-04 |
| 4849702 | Test period generator for automatic test equipment | Burnell G. West | 1989-07-18 |
| 4837521 | Delay line control system for automatic test equipment | Jeffrey A. Davis | 1989-06-06 |
| 4820944 | Method and apparatus for dynamically controlling the timing of signals in automatic test systems | Jeffrey A. Davis, E. James Cotriss | 1989-04-11 |
| 4789835 | Control of signal timing apparatus in automatic test systems using minimal memory | — | 1988-12-06 |
| 4675562 | Method and apparatus for dynamically controlling the timing of signals in automatic test systems | Jeffrey A. Davis, E. James Cotriss | 1987-06-23 |
| 4635256 | Formatter for high speed test system | — | 1987-01-06 |