| 6116779 |
Method for determining the temperature of semiconductor substrates from bandgap spectra |
Shane R. Johnson |
2000-09-12 |
| 5999307 |
Method and apparatus for controllable frustration of total internal reflection |
Lorne A. Whitehead, Robin John Noel Coope |
1999-12-07 |
| 5568978 |
Optical apparatus and method for measuring temperature of a substrate material with a temperature dependent band gap |
Shane R. Johnson, Christian Lavoie, Mark K. Nissen |
1996-10-29 |
| 5388909 |
Optical apparatus and method for measuring temperature of a substrate material with a temperature dependent band gap |
Shane R. Johnson, Christian Lavoie, Mark K. Nissen |
1995-02-14 |
| 4867840 |
Method of making artifically textured layered catalyst |
Charles B. Roxlo, Harry W. Deckman |
1989-09-19 |
| 4701366 |
Micro-porous superlattice material having zeolite-like properties |
Harry W. Deckman, Richard B. Stephens, Benjamin Abeles |
1987-10-20 |
| 4684565 |
X-ray mirrors made from multi-layered material |
Benjamin Abeles, Wolfgang Eberhardt |
1987-08-04 |
| 4598164 |
Solar cell made from amorphous superlattice material |
Benjamin Abeles |
1986-07-01 |
| 4578641 |
System for measuring carrier lifetime of semiconductor wafers |
— |
1986-03-25 |