Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10656078 | Metrology device and metrology method | Markus Heilig, Boris Povazay | 2020-05-19 |
| 10241398 | Method for application of an overgrowth layer on a germ layer | Gerald Kreindl, Harald Zaglmayr | 2019-03-26 |