Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12504384 | Wafer defect inspection system | Kaiyuan Fan | 2025-12-23 |
| 6765242 | Npn double heterostructure bipolar transistor with ingaasn base region | Albert G. Baca, Nein-Yi Li, Hong Q. Hou, Carol I. H. Ashby | 2004-07-20 |