Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11555828 | Testing probe system for testing semiconductor die, multi-channel die having shared pads, and related systems and methods | Vikrant Upadhyaya | 2023-01-17 |
| 11120855 | Semiconductor device including a clock adjustment circuit | — | 2021-09-14 |
| 10388341 | Semiconductor device including a clock adjustment circuit | — | 2019-08-20 |
| 10181343 | Semiconductor device including a clock adjustment circuit | — | 2019-01-15 |
| 9875778 | Semiconductor device including a clock adjustment circuit | — | 2018-01-23 |
| 8565032 | Semiconductor device | — | 2013-10-22 |
| 7932759 | DLL circuit and control method therefor | Katsuhiro Kitagawa | 2011-04-26 |
| 7830189 | DLL circuit and control method therefor | — | 2010-11-09 |
| 7796447 | Semiconductor memory device having output impedance adjustment circuit and test method of output impedance | — | 2010-09-14 |
| 7755401 | Semiconductor device including DLL circuit, and data processing system | — | 2010-07-13 |
| 7644325 | Semiconductor integrated circuit device and method of testing the same | — | 2010-01-05 |
| 7449931 | Duty ratio adjustment | — | 2008-11-11 |
| 7050920 | Semiconductor device having a test circuit for testing an output circuit | — | 2006-05-23 |
| 6999889 | Semiconductor device having a test circuit for testing an output circuit | — | 2006-02-14 |
| 6356490 | Semiconductor device, testing device thereof and testing method thereof | Shoichi Matsuo | 2002-03-12 |