Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Tsuneo Abe — 15 Patents

EMElpida Memory: 9 patents #63 of 692Top 10%
Micron: 5 patents #2,568 of 6,374Top 45%
Nec: 1 patents #7,928 of 14,502Top 55%
Tokyo, JP: #10,391 of 90,295 inventorsTop 15%
Overall (All Time): #307,048 of 4,157,543Top 8%
15 Patents All Time
Tsuneo Abe has been granted 15 US patents while listed as an inventor at Elpida Memory. The first was granted in 2002 and the most recent in January 2023. Tsuneo Abe ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Tsuneo Abe in Tokyo, JP.

Patents per Year

Patents granted per year, 2002 to 2023Bar chart with a peak of 4 patents in 2010.peak 42002: 1 patents20022006: 2 patents20062008: 1 patents20082010: 4 patents20102011: 1 patents20112013: 1 patents20132018: 1 patents20182019: 2 patents20192021: 1 patents20212023: 1 patents2023

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11555828 Testing probe system for testing semiconductor die, multi-channel die having shared pads, and related systems and methods Vikrant Upadhyaya 2023-01-17 $11,545,000
11120855 Semiconductor device including a clock adjustment circuit 2021-09-14 $15,044,000
10388341 Semiconductor device including a clock adjustment circuit 2019-08-20 $9,203,000
10181343 Semiconductor device including a clock adjustment circuit 2019-01-15 $44,869,000
9875778 Semiconductor device including a clock adjustment circuit 2018-01-23 $24,273,000
8565032 Semiconductor device 2013-10-22 $7,039,000
7932759 DLL circuit and control method therefor Katsuhiro Kitagawa 2011-04-26 $5,655,000
7830189 DLL circuit and control method therefor 2010-11-09 $3,205,000
7796447 Semiconductor memory device having output impedance adjustment circuit and test method of output impedance 2010-09-14 $3,952,000
7755401 Semiconductor device including DLL circuit, and data processing system 2010-07-13 $3,221,000
7644325 Semiconductor integrated circuit device and method of testing the same 2010-01-05 $5,811,000
7449931 Duty ratio adjustment 2008-11-11 $1,653,000
7050920 Semiconductor device having a test circuit for testing an output circuit 2006-05-23 $2,569,000
6999889 Semiconductor device having a test circuit for testing an output circuit 2006-02-14 $2,198,000
6356490 Semiconductor device, testing device thereof and testing method thereof Shoichi Matsuo 2002-03-12 $37,000