Tsuneo Abe has been granted 15 US patents while listed as an inventor at Elpida Memory . The first was granted in 2002 and the most recent in January 2023. Tsuneo Abe ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Tsuneo Abe in Tokyo, JP.
Patents per Year Patents granted per year, 2002 to 2023 Bar chart with a peak of 4 patents in 2010. peak 4 2002: 1 patents 2002 2006: 2 patents 2006 2008: 1 patents 2008 2010: 4 patents 2010 2011: 1 patents 2011 2013: 1 patents 2013 2018: 1 patents 2018 2019: 2 patents 2019 2021: 1 patents 2021 2023: 1 patents 2023
Issued Patents All Time
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Showing 1–15 of 15 patents
Patent # Title Co-Inventors Date Approx Value ⓘ
11555828
Testing probe system for testing semiconductor die, multi-channel die having shared pads, and related systems and methods
Vikrant Upadhyaya
2023-01-17
$11,545,000
11120855
Semiconductor device including a clock adjustment circuit
—
2021-09-14
$15,044,000
10388341
Semiconductor device including a clock adjustment circuit
—
2019-08-20
$9,203,000
10181343
Semiconductor device including a clock adjustment circuit
—
2019-01-15
$44,869,000
9875778
Semiconductor device including a clock adjustment circuit
—
2018-01-23
$24,273,000
8565032
Semiconductor device
—
2013-10-22
$7,039,000
7932759
DLL circuit and control method therefor
Katsuhiro Kitagawa
2011-04-26
$5,655,000
7830189
DLL circuit and control method therefor
—
2010-11-09
$3,205,000
7796447
Semiconductor memory device having output impedance adjustment circuit and test method of output impedance
—
2010-09-14
$3,952,000
7755401
Semiconductor device including DLL circuit, and data processing system
—
2010-07-13
$3,221,000
7644325
Semiconductor integrated circuit device and method of testing the same
—
2010-01-05
$5,811,000
7449931
Duty ratio adjustment
—
2008-11-11
$1,653,000
7050920
Semiconductor device having a test circuit for testing an output circuit
—
2006-05-23
$2,569,000
6999889
Semiconductor device having a test circuit for testing an output circuit
—
2006-02-14
$2,198,000
6356490
Semiconductor device, testing device thereof and testing method thereof
Shoichi Matsuo
2002-03-12
$37,000