Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8498831 | Semiconductor device, semiconductor device testing method, and data processing system | Akira Ide, Hideyuki Yoko, Kayoko Shibata, Kenichi Tanamachi, Takanori Eguchi +2 more | 2013-07-30 |