Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
JK

Jared Kaser — 9 Patents

ESElemental Scientific: 9 patents #14 of 56Top 25%
Fort Collins, CO: #541 of 3,421 inventorsTop 20%
Colorado: #5,216 of 40,980 inventorsTop 15%
Overall (All Time): #535,341 of 4,157,543Top 15%
9 Patents All Time
Jared Kaser has been granted 9 US patents while listed as an inventor at Elemental Scientific. The first was granted in 2021 and the most recent in June 2025. Jared Kaser ranks #535,341 of 4,157,543 US inventors in our database (top 12.9%). Patent records list Jared Kaser in Fort Collins, CO, US.

Issued Patents All Time

Showing 1–9 of 9 patents

Patent #TitleCo-InventorsDate
12320821 Autosampler system with automated sample container cover removal and sample probe positioning Daniel R. Wiederin, Beau A. Marth 2025-06-03
12094738 Systems for integrated decomposition and scanning of a semiconducting wafer Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more 2024-09-17
11804390 Systems for integrated decomposition and scanning of a semiconducting wafer Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more 2023-10-31
11705351 Systems for integrated decomposition and scanning of a semiconducting wafer Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more 2023-07-18
11694914 Systems for integrated decomposition and scanning of a semiconducting wafer Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more 2023-07-04
11476134 Systems for integrated decomposition and scanning of a semiconducting wafer Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more 2022-10-18
11406973 Autosampler arm with automated pipet securing and unsecuring Daniel R. Wiederin 2022-08-09
11244841 Systems for integrated decomposition and scanning of a semiconducting wafer Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more 2022-02-08
11049741 Systems for integrated decomposition and scanning of a semiconducting wafer Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more 2021-06-29