Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320821 | Autosampler system with automated sample container cover removal and sample probe positioning | Daniel R. Wiederin, Beau A. Marth | 2025-06-03 |
| 12094738 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more | 2024-09-17 |
| 11804390 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more | 2023-10-31 |
| 11705351 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more | 2023-07-18 |
| 11694914 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more | 2023-07-04 |
| 11476134 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more | 2022-10-18 |
| 11406973 | Autosampler arm with automated pipet securing and unsecuring | Daniel R. Wiederin | 2022-08-09 |
| 11244841 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more | 2022-02-08 |
| 11049741 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Beau A. Marth, Jonathan Hein, Jae Seok Lee +2 more | 2021-06-29 |