Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12320821 | Autosampler system with automated sample container cover removal and sample probe positioning | Daniel R. Wiederin, Jared Kaser | 2025-06-03 |
| 12300480 | Shaped-channel scanning nozzle for scanning of a material surface | — | 2025-05-13 |
| 12152966 | Systems for integrated decomposition and scanning of a semiconducting wafer | — | 2024-11-26 |
| 12094738 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more | 2024-09-17 |
| 11804390 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more | 2023-10-31 |
| 11761970 | Autosampler rail system with magnetic coupling for linear motion | Tyler Yost | 2023-09-19 |
| 11705351 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more | 2023-07-18 |
| 11694914 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more | 2023-07-04 |
| 11476134 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more | 2022-10-18 |
| 11441978 | Automatic evaporative sample preparation | Daniel R. Wiederin, Austin Schultz, Mason Spilinek | 2022-09-13 |
| 11244841 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more | 2022-02-08 |
| 11049741 | Systems for integrated decomposition and scanning of a semiconducting wafer | Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more | 2021-06-29 |