| 12320821 |
Autosampler system with automated sample container cover removal and sample probe positioning |
Daniel R. Wiederin, Jared Kaser |
2025-06-03 |
| 12300480 |
Shaped-channel scanning nozzle for scanning of a material surface |
— |
2025-05-13 |
| 12152966 |
Systems for integrated decomposition and scanning of a semiconducting wafer |
— |
2024-11-26 |
| 12094738 |
Systems for integrated decomposition and scanning of a semiconducting wafer |
Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more |
2024-09-17 |
| 11804390 |
Systems for integrated decomposition and scanning of a semiconducting wafer |
Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more |
2023-10-31 |
| 11761970 |
Autosampler rail system with magnetic coupling for linear motion |
Tyler Yost |
2023-09-19 |
| 11705351 |
Systems for integrated decomposition and scanning of a semiconducting wafer |
Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more |
2023-07-18 |
| 11694914 |
Systems for integrated decomposition and scanning of a semiconducting wafer |
Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more |
2023-07-04 |
| 11476134 |
Systems for integrated decomposition and scanning of a semiconducting wafer |
Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more |
2022-10-18 |
| 11441978 |
Automatic evaporative sample preparation |
Daniel R. Wiederin, Austin Schultz, Mason Spilinek |
2022-09-13 |
| 11244841 |
Systems for integrated decomposition and scanning of a semiconducting wafer |
Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more |
2022-02-08 |
| 11049741 |
Systems for integrated decomposition and scanning of a semiconducting wafer |
Tyler Yost, Daniel R. Wiederin, Jared Kaser, Jonathan Hein, Jae Seok Lee +2 more |
2021-06-29 |