Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6979822 | Charged particle beam system | Diane K. Stewart, Brian T. Kimball | 2005-12-27 |
| 6025592 | High temperature specimen stage and detector for an environmental scanning electron microscope | Thomas A. Hardt | 2000-02-15 |
| 5945672 | Gaseous backscattered electron detector for an environmental scanning electron microscope | Thomas A. Hardt, Peter D. Smith | 1999-08-31 |
| 5828064 | Field emission environmental scanning electron microscope | — | 1998-10-27 |
| 5412211 | Environmental scanning electron microscope | — | 1995-05-02 |
| 5362964 | Environmental scanning electron microscope | William G. Schultz, Allen E. Armstrong | 1994-11-08 |