Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8835842 | Systems and methods for investigating a characteristic of a material using electron microscopy | Stuart Ian Wright, Matthew McBride Nowell, Lisa H Chan, Tera Lyn Nylese | 2014-09-16 |
| 8735815 | Method and apparatus for electron pattern imaging | Reinhard Buchhold, Brent Hammell, Joseph A. Nicolosi | 2014-05-27 |