Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8835842 | Systems and methods for investigating a characteristic of a material using electron microscopy | Stuart Ian Wright, Matthew McBride Nowell, Peter A. de Kloe, Tera Lyn Nylese | 2014-09-16 |