Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5624190 | Method and apparatus for measuring the temperature of an object, in particular a semiconductor, by ellipsometry | Jacques Joseph, Yao Zhi Hu | 1997-04-29 |
| 4432035 | Method of making high dielectric constant insulators and capacitors using same | Ning Hsieh, Mousa H. Ishaq, Stanley Roberts | 1984-02-14 |