Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4615621 | Auto-focus alignment and measurement system and method | David L. Allen | 1986-10-07 |
| 4580900 | Auto focus alignment and measurement system and method | — | 1986-04-08 |
| 4408885 | Apparatus for the automatic alignment of two superimposed objects, e.g. a semiconductor wafer and mask | Karl-Heinz Johannsmeier, Paul E. Stoft | 1983-10-11 |
| 4292838 | Caliper gauge for the measurement of sheet members over a wide range of thicknesses | — | 1981-10-06 |
| 4277177 | Apparatus to measure select properties of a moving sheet | John J. Howarth | 1981-07-07 |
| 4259019 | Apparatus for the automatic alignment of two superimposed objects, for example a semiconductor wafer and a transparent mask | Karl-Heinz Johannsmeier, Paul E. Stoft | 1981-03-31 |