Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6724487 | Apparatus and method for measuring digital imager, package and wafer bow and deviation from flatness | Michael A. Marcus, Thomas F. Kaltenbach, Duane M. Courtney | 2004-04-20 |
| 6624891 | Interferometric-based external measurement system and method | Michael A. Marcus, Donald R. Lowry, Timothy M. Trembley | 2003-09-23 |
| 6614534 | Method and apparatus for combined measurement of surface non-uniformity index of refraction variation and thickness variation | Michael A. Marcus, Donald A. Stephenson, Thomas F. Kaltenbach | 2003-09-02 |
| 6587210 | Measurement method and apparatus of an external digital camera imager assembly | Michael A. Marcus, Eric A. Dilella, Donald R. Lowry, Timothy M. Trembley | 2003-07-01 |
| 6587209 | Measurement method and apparatus of an external digital camera imager assembly | Michael A. Marcus, Eric A. Dilella, Donald R. Lowry, Timothy M. Trembley | 2003-07-01 |
| 6522410 | Method for processing low coherence interferometric data | Michael A. Marcus | 2003-02-18 |
| 6512587 | Measurement method and apparatus of an external digital camera imager assembly | Michael A. Marcus, Eric A. Dilella, Donald R. Lowry, Timothy M. Trembley | 2003-01-28 |
| 6067161 | Apparatus for measuring material thickness profiles | Michael A. Marcus, Harry Wayne Harris, Richard R. Kelbe | 2000-05-23 |
| 6038027 | Method for measuring material thickness profiles | Michael A. Marcus, Stanley Joseph Gross, Harry Wayne Harris | 2000-03-14 |
| 6034772 | Method for processing interferometric measurement data | Michael A. Marcus | 2000-03-07 |
| 6034774 | Method for determining the retardation of a material using non-coherent light interferometery | Michael A. Marcus | 2000-03-07 |
| 5757485 | Digital camera image sensor positioning method including a non-coherent interferometer | Michael A. Marcus | 1998-05-26 |