Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6067161 | Apparatus for measuring material thickness profiles | Michael A. Marcus, Jiann-Rong Lee, Richard R. Kelbe | 2000-05-23 |
| 6038027 | Method for measuring material thickness profiles | Michael A. Marcus, Jiann-Rong Lee, Stanley Joseph Gross | 2000-03-14 |