Issued Patents All Time
Showing 1–25 of 70 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10388688 | Method of forming a shallow pinned photodiode | — | 2019-08-20 |
| 10341590 | Methods and apparatus for a CCD image sensor | Shen Wang, Eric J. Meisenzahl | 2019-07-02 |
| 10002895 | Apparatus and methods for buried channel transfer gate | Daniel Tekleab, Muhammad Maksudur Rahman, Bartosz Piotr BANACHOWICZ, Robert M. Guidash, Vladimir Korobov | 2018-06-19 |
| 9905608 | EMCCD image sensor with stable charge multiplication gain | Jaroslav Hynecek, Christopher Parks, Stephen L. Kosman | 2018-02-27 |
| 9685479 | Method of forming a shallow pinned photodiode | — | 2017-06-20 |
| 9685482 | Image sensor with buried-channel drain (BCD) transistors | — | 2017-06-20 |
| 9431456 | Image sensor with doped transfer gate | Hung Q. Doan | 2016-08-30 |
| 9000500 | Image sensor with doped transfer gate | Hung Q. Doan | 2015-04-07 |
| 8994139 | Lateral overflow drain and channel stop regions in image sensors | Edmund K. Banghart, Hung Q. Doan | 2015-03-31 |
| 8772891 | Lateral overflow drain and channel stop regions in image sensors | Edmund K. Banghart, Hung Q. Doan | 2014-07-08 |
| 8618458 | Back-illuminated CMOS image sensors | John P. McCarten, Joseph R. Summa, Cristian A. Tivarus, Todd J. Anderson | 2013-12-31 |
| 8378398 | Photodetector isolation in image sensors | Hung Q. Doan, Robert M. Guidash | 2013-02-19 |
| 8329499 | Method of forming lateral overflow drain and channel stop regions in image sensors | Edmund K. Banghart, Hung Q. Doan | 2012-12-11 |
| 8101450 | Photodetector isolation in image sensors | Hung Q. Doan, Robert M. Guidash | 2012-01-24 |
| 8076746 | Back-illuminated image sensors having both frontside and backside photodetectors | John P. McCarten, Cristian A. Tivarus, Joseph R. Summa, Hung Q. Doan, Robert M. Guidash | 2011-12-13 |
| 8048711 | Method for forming deep isolation in imagers | Hung Q. Doan | 2011-11-01 |
| 8018016 | Back-illuminated image sensors having both frontside and backside photodetectors | John P. McCarten, Cristian A. Tivarus, Joseph R. Summa, Hung Q. Doan, Robert M. Guidash | 2011-09-13 |
| 7875916 | Photodetector and n-layer structure for improved collection efficiency | David N. Nichols | 2011-01-25 |
| 7776638 | Two epitaxial layers to reduce crosstalk in an image sensor | James P. Lavine | 2010-08-17 |
| 7728277 | PMOS pixel structure with low cross talk for active pixel image sensors | Hirofumi Komori | 2010-06-01 |
| 7492404 | Fast flush structure for solid-state image sensors | John P. Shepherd, David N. Nichols | 2009-02-17 |
| 7402882 | Methods to eliminate amplifier glowing artifact in digital images captured by an image sensor | Shen-Ge Wang, William DesJardin, Robert P. Fabinski, David N. Nichols, Christopher Parks | 2008-07-22 |
| 7402787 | Method of thin lightshield process for solid-state image sensors | David N. Nichols, Stephen L. Kosman | 2008-07-22 |
| 7391001 | Thin lightshield process for solid-state image sensors | David N. Nichols, Stephen L. Kosman | 2008-06-24 |
| 7091532 | Light shield process for solid-state image sensors | — | 2006-08-15 |