Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8829898 | Method and apparatus for testing | Yosef Solt, Asaf Idan, Ofer Benjamin | 2014-09-09 |
| 8471215 | Integrated circuit sample preparation for alpha emission measurements | Ran Manor, Gil Weisman, Yair Faiershtein | 2013-06-25 |
| 8330117 | Integrated circuit sample preparation for alpha emission measurements | Ran Manor, Gil Weisman, Yair Faiershtein | 2012-12-11 |