Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7315574 | System and method for generating a jittered test signal | Mohamed M. Hafed, Gordon Roberts | 2008-01-01 |
| 7242209 | System and method for testing integrated circuits | Gordon Roberts, Antonio Chan, Mohamed M. Hafed, Sebastien Laberge, Bardia Pishdad +1 more | 2007-07-10 |