Issued Patents All Time
Showing 26–50 of 62 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5898314 | Translator fixture with force applying blind pins | — | 1999-04-27 |
| 5865641 | Solid spring electrical contacts for electrical connectors and probes | Charles J. Johnston | 1999-02-02 |
| D400811 | Test probe plunger tip | Charles J. Johnston, Gordon A. Vinther | 1998-11-10 |
| 5807063 | Circuit board loading assembly | — | 1998-09-15 |
| 5801544 | Spring probe and method for biasing | Gordon A. Vinther | 1998-09-01 |
| 5798654 | Translator fixture with module for expanding test points | David R. Van Loan | 1998-08-25 |
| 5781023 | Hollow plunger test probe | Gordon A. Vinther, Byron C. Sanderson, Charles J. Johnston | 1998-07-14 |
| 5772459 | Rotationally actuated compliant electrical connector | — | 1998-06-30 |
| 5744948 | Printed circuit board handling device | — | 1998-04-28 |
| 5729146 | Quick stacking translator fixture | — | 1998-03-17 |
| 5663655 | ESD protection for universal grid type test fixtures | Charles J. Johnston, Patrick R. Gocha | 1997-09-02 |
| 5641315 | Telescoping spring probe | Gordon A. Vinther | 1997-06-24 |
| 5633598 | Translator fixture with module for expanding test points | David R. Van Loan | 1997-05-27 |
| 5557211 | Vacuum test fixture for printed circuit boards | Mary E. Ferrer, Gary F. St. Onge, Charles J. Johnston | 1996-09-17 |
| 5493230 | Retention of test probes in translator fixtures | Patrick R. Gocha | 1996-02-20 |
| 5450017 | Test fixture having translator for grid interface | — | 1995-09-12 |
| 5447442 | Compliant electrical connectors | — | 1995-09-05 |
| 5444387 | Test module hanger for test fixtures | David R. Van Loan, Charles J. Johnston | 1995-08-22 |
| 5422575 | Test fixture with adjustable bearings and optical alignment system | Mary E. Ferrer, Gary F. St. Onge, Charles J. Johnston | 1995-06-06 |
| 5416428 | Marker probe | — | 1995-05-16 |
| 5408189 | Test fixture alignment system for printed circuit boards | Charles J. Johnston, David R. Van Loan | 1995-04-18 |
| 5391995 | Twisting electrical test probe with controlled pointing accuracy | Charles J. Johnston | 1995-02-21 |
| 5389885 | Expandable diaphragm test modules and connectors | — | 1995-02-14 |
| 5321351 | Test fixture alignment system | Charles J. Johnston, David R. Van Loan | 1994-06-14 |
| 5300881 | Test fixture | Mary E. Ferrer, Gary F. St. Onge, Charles J. Johnston | 1994-04-05 |