Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9891280 | Probe-based data collection system with adaptive mode of probing controlled by local sample properties | Vladimir A. Ukraintsev, Richard Stallcup, Mike Berkmyre, John Sanders | 2018-02-13 |
| 9506947 | System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing | Vladimir A. Ukraintsev, Richard Stallcup, Mike Berkmyre, John Sanders | 2016-11-29 |
| 9057740 | Probe-based data collection system with adaptive mode of probing | Vladimir A. Ukraintsev, Richard Stallcup, Mike Berkmyre, John Sanders | 2015-06-16 |
| 8895923 | System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing | Vladimir A. Ukraintsev, Richard Stallcup, Mike Berkmyre, John Sanders | 2014-11-25 |
| 8754571 | Two-axis inertial positioner | — | 2014-06-17 |
| 8330963 | Optical method for precise three-dimensional position measurement | Dmitri Simonian | 2012-12-11 |
| 8143763 | Linear piezoelectric nano-positioner | Zhouhang Wang, Gennady Royzenblat, Xun Pan | 2012-03-27 |
| 8063383 | Inertial positioner and an optical instrument for precise positioning | Dmitri Simonian | 2011-11-22 |