Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10620263 | System and method for fault isolation by emission spectra analysis | Prasad Sabbineni, Regina Freed | 2020-04-14 |
| 10514418 | Optimized wavelength photon emission microscope for VLSI devices | — | 2019-12-24 |
| 10049949 | In-situ packaging decapsulation feature for electrical fault localization | Tameyasu Anayama, John Muzzio | 2018-08-14 |
| 10041997 | System and method for fault isolation by emission spectra analysis | Prasad Sabbineni, Regina Freed | 2018-08-07 |
| 9903824 | Spectral mapping of photo emission | Antoine Reverdy, Thierry Parrassin | 2018-02-27 |
| 9817060 | Optimized wavelength photon emission microscope for VLSI devices | — | 2017-11-14 |
| 9322715 | Three-dimensional hot spot localization | Frank Altmann, Christian Schmidt, Rudolf Schlangen | 2016-04-26 |
| 9098892 | Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side | Rudolf Schlangen, Prasad Sabbineni, Antoine Reverdy, Ingrid De Wolf | 2015-08-04 |
| 9025020 | Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side | Rudolf Schlangen, Prasad Sabbineni, Antoine Reverdy, Ingrid De Wolf | 2015-05-05 |
| 8742347 | Three-dimensional hot spot localization | Frank Altmann, Christian Schmidt, Rudolf Schlangen | 2014-06-03 |