TH

Tetsuo Hoki

DC Dainippon Screen Mfg. Co.: 13 patents #31 of 977Top 4%
Overall (All Time): #390,529 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
5774574 Pattern defect detection apparatus 1998-06-30
5408538 Method of and apparatus for inspecting the minimum annular width of a land on a printed circuit board Ryuji Kitakado, Hisayuki Tsujinaka, Takao Omae 1995-04-18
5347591 Method of and device for determining positioning between a hole and a wiring pattern on a printed circuit board by utilizing a set of area values Hiroyuki Onishi 1994-09-13
5272762 Method of and apparatus for inspecting wiring pattern on printed board Yoshinori Sezaki, Takao Kanai, Hitoshi Atsuta 1993-12-21
5197105 Method of reading optical image of inspected surface and image reading system employabale therein Haruo Uemura 1993-03-23
5161202 Method of and device for inspecting pattern of printed circuit board Ryuji Kitakado, Hironobu Yano 1992-11-03
5150422 Method of and apparatus for inspecting conductive pattern on printed board Ryuji Kitakado, Hironobu Yano, Hiroaki KAKUMA, Takao Kanai 1992-09-22
5150423 Method of and device for inspecting pattern of printed circuit board 1992-09-22
5144681 Method of and apparatus for inspecting conductive pattern on printed board Ryuji Kitakado, Hironobu Yano, Hiroaki KAKUMA, Takao Kanai 1992-09-01
5046113 Method of and apparatus for detecting pattern defects by means of a plurality of inspecting units each operating in accordance with a respective inspecting principle 1991-09-03
5027417 Method of and apparatus for inspecting conductive pattern on printed board Ryuji Kitakado, Hironobu Yano, Hiroaki KAKUMA, Takao Kanai 1991-06-25
4803734 Method of and apparatus for detecting pattern defects Hiroyuki Onishi, Tetsuo Sano, Eiji Kodama, Hisayuki Tsujinaka, Ryuji Kitakado 1989-02-07
4797939 Pattern masking method and an apparatus therefor Tetsuo Sano, Ryuji Kitakado, Yoshinori Sezaki, Tomiji Hotta, Hironobu Yano 1989-01-10