Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7012702 | Measuring apparatus | Atsushi Tamada, Ryusuke Yamamoto | 2006-03-14 |
| 6000996 | Grinding process monitoring system and grinding process monitoring method | — | 1999-12-14 |
| 5715061 | Optical measuring apparatus and optical measuring method | — | 1998-02-03 |
| 5493401 | Method of measuring film thicknesses | Masahiro Horie, Masahiko Kokubo | 1996-02-20 |
| 5422703 | Reflected light measuring method and reflected light measuring apparatus for a microscopic photometric system | Masahiro Horie, Masahiko Kokubo | 1995-06-06 |
| 5251011 | Displacement detection system | Tokaji Shibahara | 1993-10-05 |
| 5136149 | Method of focusing optical head on object body and automatic focusing device for optical inspection system including tilt detection | Masahiro Horie | 1992-08-04 |
| 5048960 | Microspectroscope | Takahisa Hayashi | 1991-09-17 |