Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7612873 | Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring method | Masahiro Horie | 2009-11-03 |
| 6937333 | Apparatus for measuring film thickness formed on object, apparatus and method of measuring spectral reflectance of object, and apparatus and method of inspecting foreign material on object | Masahiro Horie, Hideki Hayashi, Fujikazu Kitamura | 2005-08-30 |