Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11869616 | Centrally logging and aggregating miscompares on chip during memory test | Senwen Kan, Andrew Payne, Michael Joseph Pluhta, Richard A Rodell, Jr., Bjarni Benjaminsson | 2024-01-09 |
| 6813741 | Address counter test mode for memory device | George M. Ansel, David Lindley, Junfei Fan, Andrew L. Hawkins, Michael Carlson | 2004-11-02 |
| 6400188 | Test mode clock multiplication | William G. Baker | 2002-06-04 |
| 6078637 | Address counter test mode for memory device | George M. Ansel, David Lindley, Junfei Fan, Andrew L. Hawkins, Michael Carlson | 2000-06-20 |