Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6518591 | Contact monitor, method of forming same and method of analizing contact-, via- and/or trench-forming processes in an integrated circuit | Thomas Roy Boonstra, David J. Brownell, David Crow | 2003-02-11 |
| 6121156 | Contact monitor, method of forming same and method of analyzing contact-, via-and/or trench-forming processes in an integrated circuit | Thomas Roy Boonstra, David J. Brownell, David Crow | 2000-09-19 |
| 5911887 | Method of etching a bond pad | Mark V. Smith, Walter G. Branco | 1999-06-15 |
| 5044750 | Method for checking lithography critical dimensions | — | 1991-09-03 |