Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7129178 | Reducing defect formation within an etched semiconductor topography | Benjamin Schwarz, Hanna Bamnolker, Daniel Arnzen | 2006-10-31 |
CY
Chan Lon Yan
Overall (All Time): #3,432,667 of 4,157,543Top 85%
1
Patents All Time