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Seth D. Burgett, Richard J. Daniels, Bharat Rajaram, Michael D. Wetle, Tonya An |
2018-10-23 |
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Earpiece system |
Seth D. Burgett, Richard J. Daniels, Michael D. Wetle |
2017-07-11 |
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Inspection system and method |
— |
2012-08-14 |
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Pick and place machine with component placement inspection |
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2007-07-03 |
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High speed optical image acquisition system with extended dynamic range |
— |
2006-04-11 |
| 6750899 |
Solder paste inspection system |
Timothy A. Skunes, Eric P. Rudd, David M. Kranz, Carl E. Haugan |
2004-06-15 |
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Automated system with improved height sensing |
Paul R. Haugen, Eric P. Rudd, David M. Kranz, Carl E. Haugen, Adam Reinhardt |
2004-01-13 |
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Phase profilometry system with telecentric projector |
David M. Kranz, Eric P. Rudd, Carl E. Haugan |
2003-06-10 |
| 6549647 |
Inspection system with vibration resistant video capture |
Timothy A. Skunes |
2003-04-15 |
| 6538750 |
Rotary sensor system with a single detector |
Steven K. Case, John P. Konicek, Thomas L. Volkman, Brian D. Cohn, Jeffrey A. Jalkio |
2003-03-25 |
| 6385335 |
Apparatus and method for estimating background tilt and offset |
Eric P. Rudd |
2002-05-07 |
| 6292261 |
Rotary sensor system with at least two detectors |
Steven K. Case, John P. Konicek, Thomas L. Volkman, Brian D. Cohn, Jeffrey A. Jalkio |
2001-09-18 |
| 6115491 |
Apparatus and method for estimating background tilt and offset |
Eric P. Rudd |
2000-09-05 |
| 6049384 |
Method and apparatus for three dimensional imaging using multi-phased structured light |
Eric P. Rudd, Paul R. Haugen, David M. Kranz |
2000-04-11 |
| 5331406 |
Multi-beam laser sensor for semiconductor lead measurements |
John P. Konicek, Steven K. Case, Timothy A. Skunes, Jeffrey A. Jalkio |
1994-07-19 |