| 11604062 |
Three-dimensional sensor with counterposed channels |
Paul R. Haugen, Evan J. Ribnick, Eric P. Rudd |
2023-03-14 |
| 11421983 |
Structured light projection for specular surfaces |
Eric P. Rudd, Paul R. Haugen |
2022-08-23 |
| 11176635 |
Automatic programming of solder paste inspection system |
Douglas G. Butler |
2021-11-16 |
| 11073380 |
Structured light projection for specular surfaces |
Eric P. Rudd, Paul R. Haugen |
2021-07-27 |
| 10883823 |
Three-dimensional sensor with counterposed channels |
Paul R. Haugen, Evan J. Ribnick, Eric P. Rudd |
2021-01-05 |
| 10346963 |
Point cloud merging from multiple cameras and sources in three-dimensional profilometry |
Eric P. Rudd |
2019-07-09 |
| 9816287 |
Updating calibration of a three-dimensional measurement system |
Guangyu Zhou, Eric P. Rudd |
2017-11-14 |
| 8894259 |
Dark field illuminator with large working area |
Steven K. Case, David M. Kranz, Steven A. Rose, Mark R. Schoeneck |
2014-11-25 |
| 8872912 |
High speed distributed optical sensor inspection system |
Steven K. Case, Todd D. Liberty, Timothy A. Skunes, Chuanqi Chen |
2014-10-28 |
| 8681211 |
High speed optical inspection system with adaptive focusing |
Steven K. Case, Timothy A. Skunes |
2014-03-25 |
| 8670031 |
High speed optical inspection system with camera array and compact, integrated illuminator |
Steven K. Case, Steven A. Rose, David M. Kranz |
2014-03-11 |
| 8388204 |
High speed, high resolution, three dimensional solar cell inspection system |
Steven K. Case, Timothy A. Skunes, Paul R. Haugen, Eric P. Rudd |
2013-03-05 |
| 6750899 |
Solder paste inspection system |
David Fishbaine, Timothy A. Skunes, Eric P. Rudd, David M. Kranz |
2004-06-15 |
| 6593705 |
Rapid-firing flashlamp discharge circuit |
Eric P. Rudd |
2003-07-15 |
| 6577405 |
Phase profilometry system with telecentric projector |
David M. Kranz, Eric P. Rudd, David Fishbaine |
2003-06-10 |
| 6400459 |
Methods and apparatus for using optical sensors in component replacement heads |
Bruce Peterson, Jan T. A. van de Ven |
2002-06-04 |
| 6118538 |
Method and apparatus for electronic component lead measurement using light based sensors on a component placement machine |
Jeffrey A. Jalkio, Steven K. Case |
2000-09-12 |
| 5897611 |
High precision semiconductor component alignment systems |
Steven K. Case, Jeffrey A. Jalkio, Eric P. Rudd, Bruce Peterson |
1999-04-27 |