Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11928806 | Systems and methods for evaluating part density, contamination and defects using computed tomography scanning | Yujun Wang, Ben Wang, Carl Justin Kamp, Leigh Anne Rogoski, Michael J. Cunningham +2 more | 2024-03-12 |
| 11808683 | Systems and methods for inspecting particulate filters | Krishna Pradeep Chilumukuru, James C. Clerc, Richard Adotey Allotey, Luis Fernando Loo Zazueta, Todd M. Wieland | 2023-11-07 |
| 11226277 | Systems and methods for inspecting particulate filters | Krishna Pradeep Chilumukuru, James C. Clerc, Richard Adotey Allotey, Luis Fernando Loo Zazueta, Todd M. Wieland | 2022-01-18 |