Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11928806 | Systems and methods for evaluating part density, contamination and defects using computed tomography scanning | Yujun Wang, Ben Wang, Carl Justin Kamp, Rafael Ernesto Vasquez Lombardo, Michael J. Cunningham +2 more | 2024-03-12 |