Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5517432 | Finite state machine transition analyzer | Shardul Kazi, Jim-Chwen Yeh | 1996-05-14 |
| 5230001 | Method for testing a sequential circuit by splicing test vectors into sequential test pattern | Tushar R. Gheewala | 1993-07-20 |
| 5206862 | Method and apparatus for locally deriving test signals from previous response signals | Tushar R. Gheewala | 1993-04-27 |