Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7297561 | Pattern for improved visual inspection of semiconductor devices | Christopher Sean Plunket, David B. Slater, Jr., Gerald H. Negley, Thomas Peter Schneider | 2007-11-20 |
| 6903446 | Pattern for improved visual inspection of semiconductor devices | Christopher Sean Plunket, David B. Slater, Jr., Gerald H. Negley, Thomas Peter Schneider | 2005-06-07 |
| 4511413 | Process for forming an IC wafer with buried Zener diodes | Richard S. Payne | 1985-04-16 |