| 6073263 |
Parallel processing pattern generation system for an integrated circuit tester |
Brian J. Arkin, David S. Scott |
2000-06-06 |
| 6028438 |
Current sense circuit |
— |
2000-02-22 |
| 6028439 |
Modular integrated circuit tester with distributed synchronization and control |
Brian J. Arkin, David Chan |
2000-02-22 |
| 6011403 |
Circuit arrangement for measuring leakage current utilizing a differential integrating capacitor |
— |
2000-01-04 |
| 6008683 |
Switchable load for testing a semiconductor integrated circuit device |
— |
1999-12-28 |
| 6005408 |
System for compensating for temperature induced delay variation in an integrated circuit |
— |
1999-12-21 |
| 5955890 |
Backmatch resistor structure for an integrated circuit tester |
— |
1999-09-21 |
| 5952821 |
Load circuit for integrated circuit tester |
— |
1999-09-14 |
| 5905403 |
Multiple output programmable reference voltage source |
— |
1999-05-18 |
| 4659155 |
Backplane-daughter board connector |
William B. Walkup, William C. Chow |
1987-04-21 |
| 4451918 |
Test signal reloader |
— |
1984-05-29 |