| 8400176 |
Wafer level contactor |
Alistair Nicholas Sporck |
2013-03-19 |
| 7893701 |
Method and apparatus for enhanced probe card architecture |
— |
2011-02-22 |
| 7243278 |
Integrated circuit tester with software-scaleable channels |
— |
2007-07-10 |
| 6836868 |
High-speed algorithmic pattern generator |
Gary L. Schaps |
2004-12-28 |
| 6380730 |
Integrated circuit tester having a program status memory |
John Mark Oonk |
2002-04-30 |
| 6256757 |
Apparatus for testing memories with redundant storage elements |
— |
2001-07-03 |
| 6073263 |
Parallel processing pattern generation system for an integrated circuit tester |
Garry C. Gillette, David S. Scott |
2000-06-06 |
| 6060898 |
Format sensitive timing calibration for an integrated circuit tester |
— |
2000-05-09 |
| 6028439 |
Modular integrated circuit tester with distributed synchronization and control |
Garry C. Gillette, David Chan |
2000-02-22 |
| 5963074 |
Programmable delay circuit having calibratable delays |
— |
1999-10-05 |
| 5951705 |
Integrated circuit tester having pattern generator controlled data bus |
David S. Scott, Ha Nguyen |
1999-09-14 |
| 5923197 |
Pulse stuffing circuit for programmable delay line |
— |
1999-07-13 |
| 5919270 |
Programmable formatter circuit for integrated circuit tester |
— |
1999-07-06 |
| 5917834 |
Integrated circuit tester having multiple period generators |
— |
1999-06-29 |
| 5280486 |
High speed fail processor |
Benjamin J. Brown, Peter Reichert |
1994-01-18 |