Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8400176 | Wafer level contactor | Alistair Nicholas Sporck | 2013-03-19 |
| 7893701 | Method and apparatus for enhanced probe card architecture | — | 2011-02-22 |
| 7243278 | Integrated circuit tester with software-scaleable channels | — | 2007-07-10 |
| 6836868 | High-speed algorithmic pattern generator | Gary L. Schaps | 2004-12-28 |
| 6380730 | Integrated circuit tester having a program status memory | John Mark Oonk | 2002-04-30 |
| 6256757 | Apparatus for testing memories with redundant storage elements | — | 2001-07-03 |
| 6073263 | Parallel processing pattern generation system for an integrated circuit tester | Garry C. Gillette, David S. Scott | 2000-06-06 |
| 6060898 | Format sensitive timing calibration for an integrated circuit tester | — | 2000-05-09 |
| 6028439 | Modular integrated circuit tester with distributed synchronization and control | Garry C. Gillette, David Chan | 2000-02-22 |
| 5963074 | Programmable delay circuit having calibratable delays | — | 1999-10-05 |
| 5951705 | Integrated circuit tester having pattern generator controlled data bus | David S. Scott, Ha Nguyen | 1999-09-14 |
| 5923197 | Pulse stuffing circuit for programmable delay line | — | 1999-07-13 |
| 5919270 | Programmable formatter circuit for integrated circuit tester | — | 1999-07-06 |
| 5917834 | Integrated circuit tester having multiple period generators | — | 1999-06-29 |
| 5280486 | High speed fail processor | Benjamin J. Brown, Peter Reichert | 1994-01-18 |