Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11202040 | System and method for monitoring a sample | Zeev Zalevsky, Ran CALIFA, Mark Golberg, Michael Shegei, Yevgeny BEIDERMAN | 2021-12-14 |
| 10931881 | Sample inspection utilizing time modulated illumination | Zeev Zalevsky, Ran CALIFA, Yevgeny BEIDERMAN | 2021-02-23 |