Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11957441 | System and method for depth flow inspection | Zeev Zalevsky, Sagi POLANI, Mark Golberg | 2024-04-16 |
| 11737677 | System and method for use in photoplethysmography | Zeev Zalevsky, Nisim Nisan Ozana, Javier Garcia, Sagi POLANI, Moshe Arie Ariel Schwarz +1 more | 2023-08-29 |
| 11202040 | System and method for monitoring a sample | Zeev Zalevsky, Mark Golberg, Zeev MARKMAN, Michael Shegei, Yevgeny BEIDERMAN | 2021-12-14 |
| 10931881 | Sample inspection utilizing time modulated illumination | Zeev Zalevsky, Zeev MARKMAN, Yevgeny BEIDERMAN | 2021-02-23 |
| 10724846 | System and method for use in depth characterization of objects | Zeev Zalevsky, Javier Garcia, Nisim Nisan Ozana, Moshe Arie Ariel Schwarz | 2020-07-28 |