Issued Patents All Time
Showing 26–50 of 99 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10192283 | System and method for determining clutter in an acquired image | Jason Davis, Nathaniel Bogan | 2019-01-29 |
| 10057498 | Light field vision system camera and methods for using the same | Laurens Nunnink, William Equitz | 2018-08-21 |
| 9995573 | Probe placement for image processing | Simon Barker, William M. Silver | 2018-06-12 |
| 9735036 | System and method for aligning a wafer for fabrication | Gang Liu | 2017-08-15 |
| 9679224 | Semi-supervised method for training multiple pattern recognition and registration tool models | Simon Barker | 2017-06-13 |
| 9659236 | Semi-supervised method for training multiple pattern recognition and registration tool models | Simon Barker | 2017-05-23 |
| 9533418 | Methods and apparatus for practical 3D vision system | Aaron S. Wallack | 2017-01-03 |
| 9488469 | System and method for high-accuracy measurement of object surface displacement using a laser displacement sensor | Aaron S. Wallack | 2016-11-08 |
| 9124873 | System and method for finding correspondence between cameras in a three-dimensional vision system | Lifeng Liu, Aaron S. Wallack, Cyril C. Marrion | 2015-09-01 |
| 9121751 | Weighing platform with computer-vision tracking | — | 2015-09-01 |
| 8872911 | Line scan calibration method and apparatus | Aaron S. Wallack | 2014-10-28 |
| 8705851 | Method and apparatus for training a probe model based machine vision system | Simon Barker, Adam Wagman, Aaron S. Wallack | 2014-04-22 |
| 8588511 | Method and apparatus for automatic measurement of pad geometry and inspection thereof | Gang Liu, Aaron S. Wallack | 2013-11-19 |
| 8504402 | Schedule optimization using market modeling | Chieh Hsien Tiao | 2013-08-06 |
| 8457390 | Method and apparatus for training a probe model based machine vision system | Simon Barker, Adam Wagman, Aaron S. Wallack | 2013-06-04 |
| 8189194 | Direct illumination machine vision technique for processing semiconductor wafers | John W. Schwab, Gang Liu, Lei Wang | 2012-05-29 |
| 8189904 | Image preprocessing for probe mark inspection | Aaron S. Wallack, Juha Koljonen | 2012-05-29 |
| 8162584 | Method and apparatus for semiconductor wafer alignment | James Clark, Gang Liu | 2012-04-24 |
| 8139231 | Machine vision technique for manufacturing semiconductor wafers | John W. Schwab, Gang Liu | 2012-03-20 |
| 8126260 | System and method for locating a three-dimensional object using machine vision | Aaron S. Wallack | 2012-02-28 |
| 8126253 | Automatically determining machine vision tool parameters | Aaron S. Wallack | 2012-02-28 |
| 8111904 | Methods and apparatus for practical 3D vision system | Aaron S. Wallack | 2012-02-07 |
| 8030235 | Refractory brick for steel ladles | Shyam Miglani, H. David Prior | 2011-10-04 |
| 7965887 | Method of pattern location using color image data | Aaron S. Wallack | 2011-06-21 |
| 7885453 | Image preprocessing for probe mark inspection | Aaron S. Wallack, Juha Koljonen | 2011-02-08 |