Issued Patents All Time
Showing 25 most recent of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11881000 | System and method for simultaneous consideration of edges and normals in image features by a vision system | Andrew Hoelscher, Simon Barker, David J. Michael | 2024-01-23 |
| 10957072 | System and method for simultaneous consideration of edges and normals in image features by a vision system | Andrew Hoelscher, Simon Barker, David J. Michael | 2021-03-23 |
| 10482621 | System and method for improved scoring of 3D poses and spurious point removal in 3D image data | Andrew Hoelscher, Aaron S. Wallack, David J. Michael, Hongjun Jia | 2019-11-19 |
| 10452949 | System and method for scoring clutter for use in 3D point cloud matching in a vision system | Hongjun Jia, David J. Michael, Andrew Hoelscher | 2019-10-22 |
| 9412158 | Method of configuring a machine vision application program for execution on a multi-processor computer | Jason Davis | 2016-08-09 |
| 8867847 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, E. John McGarry, Sanjay Nichani | 2014-10-21 |
| 8705851 | Method and apparatus for training a probe model based machine vision system | Simon Barker, Aaron S. Wallack, David J. Michael | 2014-04-22 |
| 8457390 | Method and apparatus for training a probe model based machine vision system | Simon Barker, Aaron S. Wallack, David J. Michael | 2013-06-04 |
| 8363972 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, E. John McGarry, Matthew L. Hill, Nigel J. Foster, Sanjay Nichani +1 more | 2013-01-29 |
| 8363956 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, E. John McGarry, Matthew L. Hill, Nigel J. Foster, Sanjay Nichani +1 more | 2013-01-29 |
| 8363942 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, E. John McGarry, Sanjay Nichani | 2013-01-29 |
| 8335380 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, E. John McGarry, Sanjay Nichani | 2012-12-18 |
| 8320675 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, E. John McGarry, Sanjay Nichani | 2012-11-27 |
| 8295613 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, E. John McGarry, Sanjay Nichani | 2012-10-23 |
| 8270748 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, Sanjay Nichani | 2012-09-18 |
| 8254695 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, E. John McGarry, Sanjay Nichani | 2012-08-28 |
| 8229222 | Method for fast, robust, multi-dimensional pattern recognition | William M. Silver, E. John McGarry, Matt Hill, Willard Foster | 2012-07-24 |
| 7251366 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Araon Wallack | 2007-07-31 |
| 7181066 | Method for locating bar codes and symbols in an image | Sateesh Nadabar, Jason Davis | 2007-02-20 |
| 7164796 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Aaron S. Wallack | 2007-01-16 |
| 7162073 | Methods and apparatuses for detecting classifying and measuring spot defects in an image of an object | Yusuf Akgul, Ivan Bachelder, Jason Davis, Juha Koljonen, Prabhav Morje | 2007-01-09 |
| 7088862 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Aaron S. Wallack | 2006-08-08 |
| 7065262 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Aaron S. Wallack | 2006-06-20 |
| 7058225 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Aaron S. Wallack | 2006-06-06 |
| 7043081 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Aaron S. Wallack | 2006-05-09 |