Issued Patents All Time
Showing 26–50 of 75 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8442304 | System and method for three-dimensional alignment of objects using machine vision | Cyril C. Marrion, Nigel J. Foster, Lifeng Liu, David Y. Li, Guruprasad Shivaram +1 more | 2013-05-14 |
| 8315457 | System and method for performing multi-image training for pattern recognition and registration | Nathaniel Bogan, Xiaoguang Wang | 2012-11-20 |
| 8189904 | Image preprocessing for probe mark inspection | Juha Koljonen, David J. Michael | 2012-05-29 |
| 8126260 | System and method for locating a three-dimensional object using machine vision | David J. Michael | 2012-02-28 |
| 8126253 | Automatically determining machine vision tool parameters | David J. Michael | 2012-02-28 |
| 8111904 | Methods and apparatus for practical 3D vision system | David J. Michael | 2012-02-07 |
| 7965887 | Method of pattern location using color image data | David J. Michael | 2011-06-21 |
| 7961201 | Method and apparatus for producing graphical machine vision content for distribution via a network | Raymond Fix | 2011-06-14 |
| 7957554 | Method and apparatus for human interface to a machine vision system | William M. Silver, Robert Shillman | 2011-06-07 |
| 7885453 | Image preprocessing for probe mark inspection | Juha Koljonen, David J. Michael | 2011-02-08 |
| 7242801 | Image preprocessing for probe mark inspection | Juha Koljonen, David J. Michael | 2007-07-10 |
| 7171036 | Method and apparatus for automatic measurement of pad geometry and inspection thereof | Gang Liu, David J. Michael | 2007-01-30 |
| 7164796 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2007-01-16 |
| 7088862 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2006-08-08 |
| 7065262 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2006-06-20 |
| 7058225 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2006-06-06 |
| 7043081 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2006-05-09 |
| 7006712 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2006-02-28 |
| 6993192 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2006-01-31 |
| 6987875 | Probe mark inspection method and apparatus | — | 2006-01-17 |
| 6985625 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2006-01-10 |
| 6975764 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2005-12-13 |
| 6931602 | Approach facilitating the selection of various machine vision functionality from among different platforms | William Silver, Raymond Fix | 2005-08-16 |
| 6856698 | Fast high-accuracy multi-dimensional pattern localization | William M. Silver, Adam Wagman | 2005-02-15 |
| 6850646 | Fast high-accuracy multi-dimensional pattern inspection | William M. Silver, Adam Wagman | 2005-02-01 |