AW

Aaron S. Wallack

CO Cognex: 60 patents #3 of 277Top 2%
CI Cognex Technology And Investment: 13 patents #4 of 74Top 6%
📍 Natick, MA: #3 of 819 inventorsTop 1%
🗺 Massachusetts: #474 of 88,656 inventorsTop 1%
Overall (All Time): #25,656 of 4,157,543Top 1%
75
Patents All Time

Issued Patents All Time

Showing 26–50 of 75 patents

Patent #TitleCo-InventorsDate
8442304 System and method for three-dimensional alignment of objects using machine vision Cyril C. Marrion, Nigel J. Foster, Lifeng Liu, David Y. Li, Guruprasad Shivaram +1 more 2013-05-14
8315457 System and method for performing multi-image training for pattern recognition and registration Nathaniel Bogan, Xiaoguang Wang 2012-11-20
8189904 Image preprocessing for probe mark inspection Juha Koljonen, David J. Michael 2012-05-29
8126260 System and method for locating a three-dimensional object using machine vision David J. Michael 2012-02-28
8126253 Automatically determining machine vision tool parameters David J. Michael 2012-02-28
8111904 Methods and apparatus for practical 3D vision system David J. Michael 2012-02-07
7965887 Method of pattern location using color image data David J. Michael 2011-06-21
7961201 Method and apparatus for producing graphical machine vision content for distribution via a network Raymond Fix 2011-06-14
7957554 Method and apparatus for human interface to a machine vision system William M. Silver, Robert Shillman 2011-06-07
7885453 Image preprocessing for probe mark inspection Juha Koljonen, David J. Michael 2011-02-08
7242801 Image preprocessing for probe mark inspection Juha Koljonen, David J. Michael 2007-07-10
7171036 Method and apparatus for automatic measurement of pad geometry and inspection thereof Gang Liu, David J. Michael 2007-01-30
7164796 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2007-01-16
7088862 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2006-08-08
7065262 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2006-06-20
7058225 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2006-06-06
7043081 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2006-05-09
7006712 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2006-02-28
6993192 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2006-01-31
6987875 Probe mark inspection method and apparatus 2006-01-17
6985625 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2006-01-10
6975764 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2005-12-13
6931602 Approach facilitating the selection of various machine vision functionality from among different platforms William Silver, Raymond Fix 2005-08-16
6856698 Fast high-accuracy multi-dimensional pattern localization William M. Silver, Adam Wagman 2005-02-15
6850646 Fast high-accuracy multi-dimensional pattern inspection William M. Silver, Adam Wagman 2005-02-01