Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7742171 | Reflectivity/emissivity measurement probe insensitive to variations in probe-to-target distance | Yoram Naor | 2010-06-22 |
| 6395192 | Method and apparatus for removing native oxide layers from silicon wafers | Yael Nemirovsky, Sara Stolyarova | 2002-05-28 |
| 6204120 | Semiconductor wafer pretreatment utilizing ultraviolet activated chlorine | Yitzhak Gilboa, Sagy Levy, Hedvi Spielberg, Itai Bransky | 2001-03-20 |
| 6191011 | Selective hemispherical grain silicon deposition | Yitzhak Gilboa, Sagy Levy, Hedvi Spielberg, Itai Bransky | 2001-02-20 |