Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345741 | Wafer inspection method and inspection apparatus | Tsun-I Wang, I-Shih Tseng, Tzu-Tu Chao | 2025-07-01 |
| 11841381 | Wafer inspection method and inspection apparatus | Tsun-I Wang, I-Shih Tseng, Tzu-Tu Chao | 2023-12-12 |
| 11573265 | Electrical component testing method and test probe | Ching-Lin Lee, Chin-Yuan Chang, Cheng-Hung Pan, Mao-Sheng LIU, Tzu-Tu Chao | 2023-02-07 |
| 11047550 | Electronic device | Chun-Mao Tseng, Chien-Yi Huang, Chao Wang, Min-Che Kao, Lu CHEN +7 more | 2021-06-29 |
| 7804589 | System and method for testing light-emitting devices | I-Shih Tseng, Jeff Lee | 2010-09-28 |