Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11573265 | Electrical component testing method and test probe | Min-Hung Chang, Ching-Lin Lee, Chin-Yuan Chang, Cheng-Hung Pan, Tzu-Tu Chao | 2023-02-07 |
| 10670627 | Electrical probe structure | Peng Chen | 2020-06-02 |
| 10254310 | Electrical probe with a probe head and contacting pins | Hsiu-Wei KUO | 2019-04-09 |
| 10215812 | Clamp-type probe device | Peng Chen | 2019-02-26 |
| 9568245 | Heating furnace | Hsiu-Wei KUO, Xin Wu, Ben-Mou Yu, Ming-Chang Wu, Kuei-Wen Lien | 2017-02-14 |