Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12341132 | Semiconductor structure | — | 2025-06-24 |
| 12293979 | Memory structure including elastic material based buffer column structure near contact structure to improve stability of connection | — | 2025-05-06 |
| 12033691 | Readout circuit layout structure, readout circuit, and memory layout structure | — | 2024-07-09 |
| 11929132 | Testing method, testing system, and testing apparatus for semiconductor chip | — | 2024-03-12 |
| 11892502 | Through-silicon via (TSV) fault-tolerant circuit, method for TSV fault-tolerance and integrated circuit (IC) | — | 2024-02-06 |
| 11886733 | Circuit for testing a memory and test method thereof | — | 2024-01-30 |
| 11869576 | Word line driving circuit and dynamic random access memory | — | 2024-01-09 |
| 11862269 | Testing method for packaged chip, testing system for packaged chip, computer device and storage medium | — | 2024-01-02 |
| 11830553 | Word line drive circuit and dynamic random access memory | — | 2023-11-28 |
| 11715543 | Memory test circuit apparatus and test method | — | 2023-08-01 |
| 11614481 | Through-silicon via detecting circuit, detecting methods and integrated circuit thereof | You-Hsien Lin, Yi-Jun Lu | 2023-03-28 |
| 11340294 | Boundary test circuit, memory and boundary test method | — | 2022-05-24 |
| 7595467 | Fault detection system and method for managing the same | Wen-Ti Lin, Hung-Wen Chiou | 2009-09-29 |
| 6420092 | Low dielectric constant nanotube | Fu-Kuo Tan-Tai, Huang-Chung Cheng | 2002-07-16 |
| 6150217 | Method of fabricating a DRAM capacitor | Ting-Chang Chang | 2000-11-21 |