Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12038569 | High sensitivity phase microscopy imaging | Sylvain Gigan, Andrés De Los Ríos Sommer | 2024-07-16 |
| 11456148 | Aberration reduction in multipass electron microscopy | Mark A. Kasevich, Stewart A. Koppell, Brannon Klopfer, Marian Mankos | 2022-09-27 |