Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8381144 | System and method of test mode gate operation | Frederick C. Jen, Li Qiu, Hsiu C. Ma, Xiang Song, Hsiaohui Wu +1 more | 2013-02-19 |
| 5400286 | Self-recovering erase scheme to enhance flash memory endurance | Sam Chu | 1995-03-21 |